Particle Beam Systems & Technology

MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States

vray@partbeamsystech.com

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chemical precursors for

Gas assisted etching

beam induced deposition

FIB or SEM - any OEM

Platinum electron SEM ion FIB beam deposition Zeiss Crossbeam Atlas GLAEX slicePlatinum deposition in FIB/SEM induced by ion (FIB) and electron (SEM) beams.

 Tungsten Deposition Focused Ion Beam Circuit Edit FIB Vectra 986 Vision IET WDR

Tungsten Molybdenum Hexacarbonyl FIB Metal Deposition Precursor Focused Ion Beam

Replacement cartridges for Tungsten W(CO)6 and Molybdenum Hxacarvony Mo(CO)6 precursor efill of metal deposition gas injector in MIcrion and FEI Vectra, Vectra 986, 986+, Vectra Vision, IET/WDR, V600, FIB400 ACE, G4 Circuit Edit FIB systems

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 


 

 

PBS&T is a trademark of MEO Engineering Company, Inc.

"Vectra," "Acura," "Micrion 2500," "Micrion 8000," "Micrion 9500," "Vectra 980," "Vectra 986," "Jupiter Head," "FEI," "Micrion," "FEI Company," "V600," "Helios," "FIB400," "FIB400 ACE," "Scios," "Sidewinder," "Certus," "ExSolve," "CLM," "Altura," "Expida," "Tomahawk," and "Phoenix" are trademarks and property of FEI Company, Inc. - now Thermo Fisher Scientific.  Omniprobe and Omni-GIS are trademarks and property of Oxford Instruments.  "Auriga," "Crossbeam," and "Zeiss" are trademarks and property of Carl Zeiss. "Orsay" and "Tescan" are trademarks and property of Tescan-Orsay Holding a.s. "eLINE," "iLINE," and "Raith" are trademarks and property of Raith GmbH. Other trademarks are property of their respective owners. These trademarks are nominatively used for the sole purpose of accurately identifying equipment compatible with PBS&T services, parts, consumables, and accessories.

Chemical deposition precursor for Platinum (Pt), Tungsten (W), Molybdenum (Mo), Carbon (C) and other materials in FIB, SEM, and FIB/SEM with tools with original FEI Mono-GIS Gas Injectin System

Focused Ion Beam Pt C W Mo dielectric deposition precursor refill FEI GIS FIB SE

Chemical deposition precursor for  Platinum (Pt), Tungsten (W), Molybdenum (Mo), Carbon (C) and other materials in  FIB, SEM, and FIB/SEM with Orsay Gas Injection System

Focused Ion Beam Pt W C Mo Deposition Precursor Raith Orsay Zeiss Tescan FIB SEM

Chemical deposition precursor for  Platinum (Pt), Tungsten (W), Molybdenum (Mo), Carbon (C) and other materials in  FIB, SEM, and FIB/SEM with GALEX D-GIS Injector

Focused Ion Beam Pt C W Mo Deposition Precursor Raith GALEX FEI Zeiss Tescan FIB

 

Chemical deposition precursor for Platinum (Pt), Tungsten (W), Molybdenum (Mo), Carbon (C) and other materials in FIB, SEM, and FIB/SEM with Omniprobe Omni-GIS Gas Injection System

 Focused Ion Beam Pt C W Mo Deposition Precursor Omniprobe Omni-GIS FEI Zeiss

Chemical deposition precursor for Tungsten (W) and Molybdenum (Mo) in Vectra 986, Vectra 986+, Vectra Vision, Vectra Vision IET/WDR Focused Ion Beam Circuit Edit systems made by former Micrion and FEI Companies

Tungsten W Molybdenum Mo Focused Ion Beam Circuit Edit Deposition Vectra FEI FIB

Chemical deposition precursor for Tungsten (W) and Molybdenum (Mo) in V600, V400, FIB400 ACE and other Focused Ion Beam Circuit Edit systems made by FEI Company, now Thermo Fisher Scientific

Tungsten W Focused Ion Beam Circuit Edit Deposition V600 FIB400 ACE G4 FEI FIB

MEO Engineering Company, Inc. is providing customized technological solutions and scientific instrumentation, including third-party accessories, consumables, parts, service, and support for Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), dual-beam FIB/SEM equipment from various manufacturers. Trademarks identifying supported FIB, SEM, and dual-beam FIB/SEM instrumentaton are property of the respective original equipment manufacturers and nominatively used for the sole purpose of accurately identifying equipment compatible with parts, services, and accessories provided by MEO Engineering Company.

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Copyright 2004-2020 MEO Engineering Company. All rights reserved.

MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States

vray@partbeamsystech.com