Particle Beam Systems & Technology

MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States
vray@partbeamsystech.com

High Voltage Repairs

During over a decade of third-party service for industrial Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) instruments, including dual-beam FIB/SEM, industrial Mask Repair and Circuit Edit FIB, Critical-Dimension CD-SEM and Defect Review DR-SEM, we developed capability of servicing and repairing high-voltage power supplies from multiple other manufacturers. Some of commonly repaired high-voltage power supplies are listed, but multiple other models have been serviced.

Contact with inquairies

MEO Engineering Company, Inc. is providing customized technological solutions and scientific instrumentation, including third-party accessories, consumables, parts, service, and support for Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), dual-beam FIB/SEM equipment from various manufacturers. Trademarks identifying supported FIB, SEM, and dual-beam FIB/SEM instrumentaton are property of the respective original equipment manufacturers and nominatively used for the sole purpose of accurately identifying equipment compatible with parts, services, and accessories provided by MEO Engineering Company.

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MEO Engineering Company, Inc.
www.partbeamsystech.com
www.fibsemproducts.com
www.freudlabs.com
United States
vray@partbeamsystech.com